Hostname: page-component-848d4c4894-pjpqr Total loading time: 0 Render date: 2024-06-22T05:50:17.711Z Has data issue: false hasContentIssue false
  • English
  • Français

Metallurgical Applications of Electron Probe Microanalysis

Published online by Cambridge University Press:  06 March 2019

David B. Wittry
David B. Wittry*
Affiliation:
California Institute of Technology, Pasadena, California
*
*Present address: University of Southern California, University Park, Los Angeles, California.
Get access

Abstract

The electron probe microanalyzer has found numerous applications in physical metallurgy. Some recent problems which have been studied with the microanalyzer constructed by the author at the California Institute of Technology include (1) determination of the penetration of chromium in chromized iron, (2) determinations of the concentration of nickel in taenite bands occurring in a fragment of meteorite from Canyon Diablo, (3) identification of intermediate phases in the as-cast structure of an alloy of titanium and copper, (4) identification of phases in the titanium—silver binary system, (5) determination of concentration fluctuations in a gold—copper alloy resulting from slow solidification, and (6) determination of the diffusion profile of nickel in single crystal sapphire.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 197 - 212
Copyright
Copyright © International Centre for Diffraction Data 1959

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Castaing, R. and Guinier, A., Proceedings of a conference on electron microscopy at Delft, 1949, Delft, 1950. Comptes rendus du premier congres international de microscopie électronique 1950, Editions de la Revue d'Optique, Paris, 1953.Google Scholar
2 Castaing, R., “Application des Sondes Electroniques a Une Méthode d'Analyse Ponctuelle Chimique et Cristallographique,” These de Doctorat 1951. Publication ONERA, No, 55,Google Scholar
3 Castaing, R., Philibert, J., and Crussard, C., “Electron Probe Microanalyzer and Its Application to Ferrous Metallurgy,” J, of Metals, April, 1957, p. 389.Google Scholar
4 Philibert, J. and Crussard, C., “Applications of the Electron Probe Microanalyzer,” J. of the Iron and Steel Inst., Vol. 183, 1956, p. 42.Google Scholar
5 Birks, L. S. and Brooks, E. J., “Applications of the Electron Probe Microanalyzer,” Proceedings of the Sixth Annual Conference on Industrial Applications of X-ray Analysis, University of Denver, 1957.Google Scholar
6 Norton, J. F., “Application of the Microemission X-ray Spectrograph — Comparison of the Analyses from Small Areas,” Proceedings of the Sixth Annual Conference on Industrial Applications of X-ray Analysis, University of Denver, 1957.Google Scholar
7 Birks, L. S. and Brooks, E. J., “Applications of the Electron Probe,” Sixteenth Annual Pittsburgh Diffraction Conference, Pittsburgh, November, 1958 (unpublished).Google Scholar
8 Macres, V., Norton, J. T., and Ogilvie, R. B., “Interface Compositions in CuZn Diffusion Couples,” Sixteenth Annual Pittsburgh Diffraction Conference, Pittsburgh, November, 1958 (unpublished).Google Scholar
9 Fisher, R. M., “Electron Probe Microanalysis of Submicron Precipitates in Steels,” J. Appl. Phys., Vol. 28, 1957, p, 1379; (abstract of paper presented at the fifteenth annual meeting of the Electron Microscope Society of America, Boston, September, 1957).Google Scholar
10 Schwartz, C. S., Austin, A. E., and Richard, N. A., “Application of the Electron Probe Microanalyzer to Segregation and Diffusion,” Sixteenth Annual Pittsburgh Diffraction Conference, Pittsburgh, November, 1958 (unpublished).Google Scholar
11 Lewis, R. K. and Fisher, R. M., “Electron Probe Microanalysis of Meteorites,” Sixteenth Annual Pittsburgh Diffraction Conference, Pittsburgh, November, 1958 (unpublished).Google Scholar
12 Yavnel, A. A., Borowskii, I. B., Ilyan, N. P., and Marchukova, I. O., “Determination of the Composition of the Phases of Mete or i tic Iron by Means of the Local X-ray Spectroscopic Analysis,” Meteorite Conference, Moscow, June 4, 1958.Google Scholar
13 Maringer, R. E., Richard, N. A., and Austin, A. E., “Microbeam Analysis of Widmanstatten Structure in Meteoritic Iron,” Transactions of the Metallurgical Society of AIME, Vol. 215, 1959, p. 56.Google Scholar
14 Wittry, D. B., DuMond, J. W. M. and Duwez, Pol, “Use of the Electron Probe Microanalyzer in the Study of Semiconductor Alloys,” Conference on Properties of Elemental and Compound Semiconductors, Boston, September, 1959 (Proceedings to be published by Interscience).Google Scholar
15 Wittry, D. B., “An Electron Probe for Local Analysis by Means of X-rays,” Ph.D. Thesis, California Institute of Technology, Pasadena, California, 1957.Google Scholar
16 Hansen, Max, The Constitution of Binary Alloys, McGraw-Hill, New York, 1958, p. 59.Google Scholar