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Influence of Goniometric Arrangement and Absorption in Qualitative and Quantitative Analysis of Powders by X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

J. Leroux  and
M. Mahmud
J. Leroux
Affiliation:
Department of National Health and Welfare Ottawa, Canada
M. Mahmud
Affiliation:
Department of National Health and Welfare Ottawa, Canada
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Abstract

A theoretical approach of some factors influencing the intensity diffracted by a polycrystalline material at a definite Bragg angle has been confirmed by experimental data obtained with a high-angle Norelco diffractometer. The factors mainly considered are the focusing arrangement of the goniometer which delineates the geometric shape of the volume fraction of the sample being irradiated and the absorption of the latter.

Tests have been performed (a) with quartz mixed in samples covering a large range of absorption coefficients, (b) with two different K radiations using copper and molybdenum targets, (c) with three different angles of beam divergence of 1, ½, and ¼°, respectively, and (d) with the sample packed and leveled in a copper grid with openings of about 350 μ. As this test with copper grids was to demonstrate that each opening was acting like a volume of sample irradiated by a beam of extremely small divergence (0.1°), it also shows that more accuracy in the measurement of the exact Bragg angle can be reached in these conditions as compared to that obtained with conventional sample holders.

A general equation, suitable for qualitative and quantitative analysis when these factors have to be taken into consideration, is proposed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 337 - 348
Copyright
Copyright © International Centre for Diffraction Data 1959

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References

1 Alexander, L. and Klug, H. P., Anal. Chem., Vol. 20, 1948, p. 886.Google Scholar
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3 Leroux, J., Norelco Reporter, Vol. IX, No. 5, Sept.-Oct., 1957.Google Scholar
4 Peiser, H. S., Rooksby, H. P., and Wilson, A. J. C., Technical Editors, X-Ray Diffraction by Polycrystalline Materials, Institute of Physics, London, 1955.Google Scholar
5 Klug, H. P. and Alexander, L., X-Ray Diffraction Procedures, John Wiley and Sons, 1954.Google Scholar