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IEE - A New Type of X-Ray Photoelectron Spectrometer

Published online by Cambridge University Press:  06 March 2019

N. H. Weichert  and
J. C. Helmer
N. H. Weichert
Affiliation:
Variarx Associates Palo Alto, California 94303
J. C. Helmer
Affiliation:
Variarx Associates Palo Alto, California 94303
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Abstract

A new type of x-ray photoelectron spectrometer has been designed. Although smaller in size, the new instrument shows a considerable improvement in sensitivity compared to other photoelectron spectrometers. This has been achieved through the provision of several new features: The photoelectrons are retarded to low energy (10 eV through 100 eV) before entering the deflecting energy analyzer. A spherical electrostatic analyzer in figure of rotation is used. Annular slits at both source and detector provide a large effective source area. The instrument is shielded against external magnetic fields (earth magnetic field and a.c. fields) by a double layer of mu-metal, thus avoiding the installation of large Helmholtz coils.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 13: Eighteenth Annual Conference on Applications of X-ray Analysis, August 6-8, 1969 , 1969 , pp. 406 - 417
Copyright
Copyright © International Centre for Diffraction Data 1969

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References

1. Siegbahn, K. et. al., “ESCA, Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy”, Almquist & Wicksells Boktryckeri AB, Uppsala 1967.Google Scholar
2. Helmer, J. C. and Weichert, W. H., “Enhancement of Sensitivity in ESCA Spectrometers”, Appl. Phys. Letters 13, 266 (1968).Google Scholar
3. Purcell, E. M., “The Focusing of Charged Particles by a Spherical Condenser”, Phys. Rev. 54, 818 (1938).Google Scholar
4. See e.g. references 2-10 in Kessler, J. and Weichert, N., “Untersuchungen an einem Energieanalysator für Relativestische Elektronen”, Nuclear Instrum. 29, 245 (1964).Google Scholar