Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-18T01:45:20.096Z Has data issue: false hasContentIssue false
  • English
  • Français

Fundamental Parameters vs. Multiple Regression Calculations for the Determination of Europium in Oxide Catalyst Supports by XRF

Published online by Cambridge University Press:  06 March 2019

Eva M. Kenny  and
Harry G. Brittain
Eva M. Kenny
Affiliation:
Halcon Research 1 Philips Parkway, Montvale New Jersey 07645
Harry G. Brittain
Affiliation:
Seton Hall University, Chemistry Department South Orange, New Jersey 07079
Get access

Abstract

Fundamental parameters calculations are used for the analysis of europium in the concentration range of 0.1 WT% to 30.0 WT% in the oxidic catalyst supports alumina, calcia, magnesia lanthania, and thoria. The precision and accuracy of this method is dependent on how the sample matrix is defined in the fundamental parameters program and the number and concentration of the standards used. Results comparable to the multiple regression method are obtained when the matrix stoichiometry is defined as Eu2O3 and the catalyst oxide (i.e. Al2O3 etc). It is also necessary to use standards which bracket the europium concentration in the samples. When these conditions are met, the results are comparable to those obtained from a ten point multiple regression calibration curve but with a considerable saving of standard preparation time. The precision is better than ±2% relative. The % relative difference between the fundamental parameters and multiple regression results is also 2%. Data is presented which illustrates the effect of defining the sample stoichiometry in the XRF11 computer program.

Type
VI. XRF Applications: Mineralogical, General
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 209 - 214
Copyright
Copyright © International Centre for Diffraction Data 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Pott, G.T., and Stork, W.H.J., Catal. Rev., 12, 163 (1975).Google Scholar
2. DeKalb, E.L., and Fassel, V.A., “Handbook on the Physics and Chemistry of Rare Earths”, vol 4, North-Holland Publishing Company: New York, 1979; Chapter 37D.Google Scholar
3. Tertian, R., Advan. X-ray Anal., 12, 546 (1969).Google Scholar
4. Rose, H. J., and Cuttitta, , F . Appl. Spectrosc., 22, 426 (1968).Google Scholar
5. Plowman, C., Analyst, 96, 776 (1971).Google Scholar
6. Lytle, F.W., and Heady, H.H., Anal. Chem., 31, 809 (1959).Google Scholar
7. Stone, I.C.., and Rayburn, K. A., Anal. Chem., 39, 356 (1967).Google Scholar
8. Palme, C., and Jagoutz, E., Anal. Chem., 40, 717 (1977).Google Scholar
9. Criss, J.W., and Birks, L.S., Anal. Chem., 40, 1080 (1968).Google Scholar
10. Pella, P.A., and Sieber, J.R., X-ray Spectrom., 11, 167 (1982).Google Scholar
11. Criss, J.W., Advan. X-ray Anal., 23, 93 (1980).Google Scholar
12. Criss, J.W., Birks, L.S., and Gilfrich, J.V., Anal. Chem., 50, 33 (1978).Google Scholar
13. Alley, B.J., and Myers, R.H., Anal. Chem., 37, 1685 (1965).Google Scholar
14. Stephenson, D.A., Anal. Chem., 43, 310 (1971).Google Scholar
15. Plesch, R., Siemens Analytical Application Note, No, 28.Google Scholar
16. Plesch, R., and Thiele, B., Siemens Analytical Application Note, No.33.Google Scholar
17. Thiele, B., and Plesch, R., Siemens Analytical Application Note, No. 41.Google Scholar
18. Jenkins, R., and DeVries, J. L., “Practical X-ray Spectrometry”, Springer-Verlag: New York, 1967; Chapters 1, 6, and 8.Google Scholar
19. Jenkins, R., and DeVries, J.L., “Worked Examples in X-ray Analysis”; Springer-Verlag; New York, 1970; pp 74–79.Google Scholar
20. Bertin, E.P., “Principles and Practice of X-ray Spectrometric Analysis“; Plenum; New York, 1970; Chapter 11.Google Scholar