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The Evaluation of the PXQ for the Analysis of Cements and Related Materials

Published online by Cambridge University Press:  06 March 2019

George Andermann ,
J. L. Jones  and
E. Davidson
George Andermann
Affiliation:
Applied Research Laboratories, Inc., Glendale, California
J. L. Jones
Affiliation:
Applied Research Laboratories, Inc., Glendale, California
E. Davidson
Affiliation:
Applied Research Laboratories, Inc., Glendale, California
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Abstract

The analysis of cements and ores has been studied using the Applied Research Laboratories, Inc. Production Control X-ray Quantometer (PXQ), Elements included in the program were magnesium, aluminum, silicon, phosphorus, calcium and iron. The PXQ, utilizing the polychromator concept, allows the simultaneous determination of the listed elements.

Focusing ADP, EDT, quartz and LiF crystals were used with flow Geigers or Multitrons. Helium paths were used as required. The choice of crystals, detectors, and slit widths was determined to give optimum results for each element.

The effects of briquetting and ratioing to scattered background on accuracy were studied. Various instrumental factors such as helium flow rate, detector gas flow rate, short and long term stability were also investigated.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 215 - 227
Copyright
Copyright © International Centre for Diffraction Data 1958

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References

1 Kemp, J. W., Davidson, E., Jones, J. L. and Paschen, K. W., “Instrument Design Factors in X-Ray Poly chroma tors,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, 1957.Google Scholar
2 Jones, J. L., Paschen, K. W., Swain, H. H. and Andermann, George, “Componems for X-Ray Polyctiromators,” Sixth. Annual Conference on Industrial Applications o£ X-Ray Analysis, Denver, 1957.Google Scholar
3 Davidson, E., Gilkerson, A. W., and Kemp, J. W., “The PXO a Direct Reading X-Ray Polychromator,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, 1958.Google Scholar
4 Andermann, George. and Kemp, J. W., “Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy,” Analytical Chemistry Vol. 30, 1958, p. 1306.Google Scholar