Hostname: page-component-77c89778f8-cnmwb Total loading time: 0 Render date: 2024-07-16T13:02:57.660Z Has data issue: false hasContentIssue false
  • English
  • Français

Energy Dispersive X-ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

Michael Mantier  and
William Parrish
Michael Mantier
Affiliation:
IBM Research Laboratory San Jose, California 95193
William Parrish
Affiliation:
IBM Research Laboratory San Jose, California 95193
Get access

Abstract

This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the contribution from the specimen, S, and the detector resolution function, D.

Type
X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 171 - 186
Copyright
Copyright © International Centre for Diffraction Data 1976

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Giessen, B. C. and Gordon, G. E., “X-ray Diffraction: New High-Speed Technique Based on X-ray Spectrography,” Science 159, 973–975 (1968).Google Scholar
2. Lauriat, J. P. and Pério, P., “Adaptive d'un Ensemble de Détection Si(Li) áun Diffractoraetre X,” J. Appl. Cryst. 5, 177–183 (1972).Google Scholar
3. Sparks, C. J. and Gedcke, D. A., “Rapid Recording of Powder Diffraction Patterns with Si(Li) X-ray Energy Analysis System: W and Cu Targets and Error Analysis,” Adv. in X-ray Anal. 15, 240–253 (1972).Google Scholar
4. Fukamachi, T., Hosoya, S. and Terasaki, O., “The Precision of Interplanar Distances Measured by an Energy-Dispersive Diffractometer,” J. Appl. Cryst.6, 117–122 (1973).Google Scholar
5. Laine, E., Lähteenmäki, I., and Hämäläinen, M., “Si(Li) Semiconductor Detector in Angle and Energy Dispersive X-ray Diffractometry,” J. of Phys. E: Sci. Instrum. 7, 951–954 (1974).Google Scholar
6. Wilson, A. J. C., “Note on the Aberrations of a Fixed-Angle Energy- Dispersive Powder Diffractometer,” J. Appl. Cryst. 6, 230–237 (1973).Google Scholar
7. Buras, B., Olsen, J. S., Gerward, L., Selsmark, B. and Andersen, A. L., “Energy-Dispersive Spectroscopic Methods Applied to X-ray Diffraction in Single Crystals,” ActaCryst. A31, 327–333 (1975).Google Scholar
8. Bearden, J. A., X-ray Wavelengths, NYO-10586, U. S. Atomic Energy Comm. (1964).Google Scholar
9. Parrish, W., Huang, T. C. and Ayers, G. L., “Profile Fitting: A Powerful Method of Computer X-ray Instrumentation and Analysis,” Trans. Am. Cryst. Assoc. 12, (1976).Google Scholar
10. IBM System/360 and System/370, IBM 1130 and IBM 1800 Subroutine Library - Mathematics, Manual SH 12-5300-1.Google Scholar
11. Zachariasen, W. H., Theory of X-ray Diffraction in Crystals, J. Wiley, New York 1945.Google Scholar
12. von Laue, M., Röntgenstrahl-Interferenzen, Akad.Verlag., Frankfurt (1960).Google Scholar
13. Cole, B., “Bragg's Law and Energy Sensitive Detectors,” J. Appl. Cryst. 3, 405–406 (1970).Google Scholar