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The Design and Use of Special-Purpose Attachments for the Horizontal Diffractometer

Published online by Cambridge University Press:  06 March 2019

William L. Baun
Affiliation:
Aeronautical Systems Division Wright-Patterson Air Force Base
John J. Renton
Affiliation:
Aeronautical Systems Division Wright-Patterson Air Force Base
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Abstract

Several special-purpose attachments have been designed and built for the Siemens horizontal diffractometer. Design details and experimental results are shown for the following equipment: (1) Low-temperature mount for poly crystalline materials—examples are shown illustrating identification of organic liquids crystallized at low temperatures, and results are presented on coefficient of thermal expansion of alloys in the binary system copper—platinum from −185 to 25°C. (2) Low-temperature mount for single-crystal studies—this design allows recording of higher-level layer lines by use of a domed beryllium window. Illustrations are shown for organic single crystals and for organic liquids crystallized in the lowtemperature mount. (3) Focusing attachment—this attachment uses a curved specimen mounted on the focusing circle (Seeman-Bohlin mounting). Comparisons of dispersion are made and examples such as the (400) reflection from molybdenum are shown using both curved and flat specimens. (4) Full-circle goniometer—this device has been used primarily for determining distribution of intensity in amorphous and semicrystalline polymers, but is applicable to study of single crystals. Examples of both of these applications are discussed.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1963

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References

1. Baun, W. L. and Renton, J. J., ASD TDR 63-278, April 1963. Available from OTS.Google Scholar
2. Pike, E. R., J. Sci. Instr. 39: 222, 1962.Google Scholar