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Correcting Effect of Preferred Orientation in Transparent Samples

Published online by Cambridge University Press:  06 March 2019

Matti Järvinen ,
Marja-Liisa Laakkonen  and
Timo Paakkari
Matti Järvinen
Affiliation:
Lappeenranta University of Technology, P.O.Box 20, SF-53851, Lappeenranta, Finland
Marja-Liisa Laakkonen
Affiliation:
University of Helsinki, SF-00170, Helsinki, Finland
Timo Paakkari
Affiliation:
University of Helsinki, SF-00170, Helsinki, Finland
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Extract

Accurate diffraction intensity measurement from powder samples with a modern automatic x-ray diffractometer is nowadays a routine work. Most of the difficulties are caused because the samples are not the ideal ones. Especially, the effect of preferred orientation (or texture) may drastically distort the ratios of intensities in the collected data. To diminish these effects more careful preparation of the samples is needed. This is, however, often tedious and its success is not certain.

Type
V. Texture Analysis by XRD
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 303 - 308
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Järvinen, M., Merisalo, M., Pesonen, A. and Inkinen, O., 1970, Correction of Integrated X-ray Intensities for Preferred Orientation in Cubic Powders, J. Appl. Phys. 3, 313–318.Google Scholar
2. Ahtee, M., Nurmela, M., Suortti, P. and Järvinen, M., 1989, Correction for Preferred Orientation in Pdetveld Refinement, J. Appl. Cryst. 22, 261–268.Google Scholar
3. Paakkari, T., Blornberg, M., Serimaa, R. and Järvinen, M., 1988, A Texture Correction for Quantitative X-ray Powder Diffraction Analysis of Cellulose, J. Appl. Phys. 21, 393–397.Google Scholar
4. Cullity, B.D., “Elements of X-ray Diffraction”, Addison-Wesley, MA, p. 307 (1978).Google Scholar