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A Computer Control for an X-Ray Fluorescence Analysis Unit

Published online by Cambridge University Press:  06 March 2019

B. E. Artz ,
Carol J. Kelly  and
M. A. Short
B. E. Artz
Affiliation:
Ford Motor Company, Scientific Research Staff Dearborn, Michigan 48121
Carol J. Kelly
Affiliation:
Ford Motor Company, Scientific Research Staff Dearborn, Michigan 48121
M. A. Short
Affiliation:
Ford Motor Company, Scientific Research Staff Dearborn, Michigan 48121
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Abstract

An X-ray fluorescence analysis unit has been automated with a multi-position sample changer, a stepping motor to position the spectrometer, and computer addressable switches to control the selection of crystal, detector, collimator, and beam filter. The unit can be controlled off-line through a Teletype or on-line with a computer. This computer utilizes a multi-user program for the simultaneous operation of the fluorescence analysis unit and two diffractometers. Programming the system for any desired analytical or research procedure is accomplished using an expanded version of BASIC.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 309 - 316
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

1. Seifert, Lothar, Brown, George A., and Heintz, Frieder, “Features of-the Siemens New Sequential X -Ray Spectrometer with Automatic Program Control,” Siemens Review, 35, 32–41 (1968).Google Scholar
2. Croke, J. F. and Jenkins, R., “Automation of a Manual Spectrometer b y use of a Hardwired Angle Programmer and Microcomputer,” in L, S. Birks et al., Editors, Advances in X-Ray Analysis, Vol. 16, pp. 273–283, Plenum Press (1973).Google Scholar
3. Kelly, Carol J. and Sichen, E., “Computer Controlled X -Ray Diffraction Measurement of Residual Stress,” in L. S. Birks et al., Editors, Advances in X-Ray Analysis, Vol. 16, pp. 344–353, Plenum Press (1973).Google Scholar
4. Short, M. A., “Detection and Correction of Non-Linearity in X-iRay Counting Systems,” in J. Bumlda, Editor, Proceedings of the 5th Conference on X -Ray Analytical Methods, pp. 60-62, N. V. Philips’ Gloeilampenfabrieken (1966).Google Scholar
5. Jenkins, R. and De Vries, J. L., Worked Examples in X-Ray Analysis, pp. 105–107, Springer-Verlag (1970).Google Scholar
6. Larson, J. A., Short, M. A., Bonfiglio, S., and Allie, W., “An X-Ray Fluorescence Technique for the Analysis of Lead In Gasoline,” X-Ray Spectrometry, to be published.Google Scholar