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The Computer Calculation, from Fundamental Parameters, of Influence Coefficients for X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

C.E. Austen  and
T.W. Steele
C.E. Austen
Affiliation:
National Institute for Metallurgy, Johannesburg, Republic of South Africa
T.W. Steele
Affiliation:
National Institute for Metallurgy, Johannesburg, Republic of South Africa
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Abstract

A system for the calculation of first-order influence coefficients for any element in any matrix is described in detail. Influence coefficients for either K or L spectra can be evaluated by the method described.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 362 - 371
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

1. Austen, C. E. and Russell, B. G., “The analysis of Silicate Rocks and Metallurgical Slags by X-ray Fluorescence Spectrometry”. Johannesburg, National Institute for Metallurgy, Report No. 1599. 1974.Google Scholar
2. Heinrick, K. F. J.. The electron microprobe. Proceedings of the Symposium sponsored by the Electrochemical Society, October 1964. p. 296.Google Scholar
3. Birks, L. S., “Electron probe microanalysis”. 2nd edition, New York, Wiley Interscience, 1971.Google Scholar
4.International Union of Crystallography. Tables of X-ray crystallography, Birmingham, Kynoch Press. 1968. vol. 3.Google Scholar
5. Fink, R. W., “Atomic fluorescent yields”. Rev. mod. phys., vol. 38, no. 3. Jul, 1966.Google Scholar
6. Bailey, L. E., and Swedlund, J. B., “X-ray fluorescent yields of Al, Cl, Ar, Sc, Ti, V, Mn, Fe, Co, Y and Ag. Phys. Rev. vol. 158, no. 1. 5th Jun., 1967.Google Scholar
7. Sherman, J., “The theoretical determination of fluorescent X-ray intensities from mixtures”. Spectrochim. Acta, vol. 7. 1955. pp. 283–306.Google Scholar
8. Shiraiwa, T., and Fujiino, N.. Japan J. Appl. Phys., vol. 5. 1966. p. 886.Google Scholar
9. Gilfrich, J. V. and Birks, L. S., “Spectral distribution of X-ray tubes for quantitative X-ray fluorescence analysis”. Analyt. Chem., vol. 40. No. 7. Jun. 1968.Google Scholar
10. Birks, L. S., “X-ray spectrochemical analysis”, 2nd edition, New York, Wiley Interscience, 1969.Google Scholar
11. Criss, J. W., and Birks, L. S., “Calculation methods for fluorescent X-ray spectrometry”. Analyt. Chem., vol. 40, no. 7, Jun, 1968.Google Scholar
12. Abbey, S.. “U.S. Geological Survey Standards - a critical study of published analytical data”, Canad. Spectrosc., vol. 15, Jan. 1970.Google Scholar
13. Russell, B. G., et al. Preliminary report on the analysis of the six NIMROC geochemical standard samples. Johannesburg, National Institute for Metallurgy, Report no. 1351. 1972.Google Scholar
14. Austen, C. E.. “The computer calculation, from fundamental parameters, of influence coefficients for X-ray spectrometry”. Johannesburg, National Institute for Metallurgy, Report no. 1581. 1974.Google Scholar