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Application of Guinier Camera, Microcomputer Controlled Film Densitometry, and Pattern Search-Match Procedures to Rapid Routine X-Ray Powder Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

J. W. Edmonds  and
W. W. Henslee
J. W. Edmonds
Affiliation:
Dow Chemical Company Midland, MI 48640
W. W. Henslee
Affiliation:
Dow Chemical Company Freeport, TX 77541
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Extract

In most routine chemical analyses, a trade-off is made between quality of data and time required to obtain and analyze the data.In X-ray powder diffraction, identifications are normally made by Debye-Scherrer film methods or by medium speed (1-2°20/min.) diffractometry, with or without an internal standard. With one notable exception, the inherent precision of the Guinier camera geometry has been virtually ignored as too expensive or time consuming for routine work, or relegated to special projects. The accessibility of microcomputers, however, not only makes it economically and realistically feasible to automate the equipment previously used for special Guinier projects, but to extend the overall precision of observed d-spacings into the area of routine analysis. Search-match procedures benefit from the increased data precision to such an extent that they can be used routinely to propose the identity of major pure phases and release the analyst to concentrate on minor components and impure phases which may be subject to lattice constant shifts.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 22: Twenty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-4, 1978 , 1978 , pp. 143 - 150
Copyright
Copyright © International Centre for Diffraction Data 1978

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References

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