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Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semrcrystallkve Polymers

Published online by Cambridge University Press:  06 March 2019

N. Sanjeeva Murthy
N. Sanjeeva Murthy*
Affiliation:
Research and Technology, AlliedSignal Inc. P.O. Box 1021, Morristown, New Jersey 07962
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Abstract

X-ray diffraction (XRD) scans of many semicrystalline polymers, in which noncrystalline (amorphous) phases with varying degrees of order coexist with more than one crystalline phases, are usually not well resolved. Resolution of such data can be enhanced by deconvolving the effect of size broadening using maximum entropy methods. The use of resolution-enhanced XRD scans for studying the order in the noncrystalline (amorphous) domains and for studying small differences in the crystalline regions in poorly crystallized polymers is illustrated with examples from polyamides and polyesters. Crystallinity in poorly crystallized polymers is determined using an amorphous template obtained by analyzing highly crystalline polymers. The degree of order in the noncrystalline regions is evaluated from the changes in the shape and the position of the amorphous scattering. It is suggested that these procedures can be a part of the documentation of laboratory procedures required for ISO (International Organization for Standards) certification.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 505 - 514
Copyright
Copyright © International Centre for Diffraction Data 1995

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