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An X-Ray Camera for Precision Lattice Parameter Measurements

Published online by Cambridge University Press:  06 March 2019

A. Franks
A. Franks*
Affiliation:
National Physical Laboratory, Teddington, Middlesex, England
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Abstract

A back-reflection focusing camera has been constructed in which instrumental errors, including those due to uneven film shrinkage, have been eliminated or very much reduced. This has been achieved by employing metrological techniques both in construction and calibration, The temperature of the camera can be controlled to 0.05°C. The form of the specimen is such that horizontal and vertical divergence cause no line shift. The X-ray source is a demountable semimicrofocus tube with an adjustable focus. The radiation is monochromatized by a bent and ground quartz crystal.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 69 - 76
Copyright
Copyright © International Centre for Diffraction Data 1959

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References

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