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An Algorithm for Correction of Intensity Aberrations in Bragg-Brentano X-Ray Diffractometer Data; Its Importance in the Multiphase Full-Profile Rietveld Quantitation of a Montmorillonite Clay

Published online by Cambridge University Press:  06 March 2019

C.E. Matulis  and
J.C. Taylor
C.E. Matulis
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
J.C. Taylor
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
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Abstract

Intensity aberrations in Bragg-Brentano X-ray diffractometers reduce the measured intensities at low angles relative to higher angles, and the correction factor can be large at low 2θ angles. Aberration-free data is of great importance in full-profile Rietveld quantitative analysis or structure refinement. An algorithm is given which corrects the intensity aberrations for particular instrument dimensions and sample absorbance, with a fixed divergence slit. Variable divergence slits increase the Bragg-Brentano aberrations and skew the data. The importance of an aberration correction curve produced with the computer program BBCCURV is described in the multiphase Rietveld quantitation of a montmorillonite clay with the SIROQUANT quantitative analysis program system; good quantitation of the montmorillonite can only be obtained if the aberration corrections are applied.

Type
VI. Whole Pattern Fitting, Phase Analysis by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 301 - 307
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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