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Absorption Correction Curves Obtained from Measurements of the Production of X-Rays as a Function of Depth

Published online by Cambridge University Press:  06 March 2019

J.D. Brown  and
L. Parobek
J.D. Brown
Affiliation:
The University of Western Ontario, London, Canada
L. Parobek
Affiliation:
The University of Western Ontario, London, Canada
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Abstract

Measurements of x-ray production as a function of depth in a sample (ϕ(ρz) curves) are fundamental to the determination of the quantitative equations for relating x-ray intensity to composition in electron probe microanalysis. These ϕ(ρz) curves have been measured for four different voltages and a number of different tracers in aluminum, copper, silver arid gold as matrix elements. From these ϕ(ρz) curves the absorption correction curves (f(x) curves) can be calculated. Such curves have been obtained and comparison is made with the absorption correction equations of Philibert. The effect of a tilted sample on the absorption correction is also discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 198 - 205
Copyright
Copyright © International Centre for Diffraction Data 1972

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References

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