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X-Ray Fluorescence Critical Sample Thickness and Volume of Material Excited in Catalysts

Published online by Cambridge University Press:  06 March 2019

Frank Kunz  and
Ronald Belitz
Frank Kunz
Affiliation:
Analytical Sciences Department Ford Research Laboratory Dearborn, MI
Ronald Belitz
Affiliation:
Analytical Sciences Department Ford Research Laboratory Dearborn, MI
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Extract

During the past fifteen years wavelength dispersive x-ray fluorescence (WDXRF) spectrometry has been the primary analytical technique for quantitative elemental analysis of automotive catalyst precious metals, contaminants, and substrate materials. While extensive work has been devoted to improving the accuracy of WDXRF quantitative procedures, minimal attention has been given to the calculation of critical sample thickness (primary x-ray beam depth of penetration) and total volume of material excited for each element in the catalyst. However, with the increasing use of WDXRF for measuring and comparing elemental concentrations at the inlet, middle, and outlet surfaces of catalysts, critical sample thickness and volume of material excited becomes very important for accurate interpretation of results.

Type
IV. On-Line, Industrial and Other Applications of XRS
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 145 - 154
Copyright
Copyright © International Centre for Diffraction Data 1992

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