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The Use of Person VII Distribution Functions in X-Ray Diffraction Residual Stress Measurement

Published online by Cambridge University Press:  06 March 2019

Paul S. Prevey*
Affiliation:
Lambda Research, Inc. 1111 Harrison Avenue Cincinnati, OH 45214
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Abstract

The fitting of a parabola by least squares regression to the upper portion of diffraction peaks is commonly used for determining lattice spacing in residual stress measurement. When Kα techniques are employed, the presence of the Kα doublet is shown to lead to significant potential error and non- linearities in lattice spacing as a function of Sin2ψ caused by variation in the degree of blending of the doublet. An algorithm is described for fitting Pearson VII distribution functions to determine the position of the Kα component, eliminating errors caused by defocusing of diffraction peaks of intermediate breadth. The method is applied to determine the subsurface residual stress distribution in ground TI-6 AI- 4 V, comparing directly the use of parabolic and Pearson VII peak profiles, and is shown to provide precision better than ± 1%% in elastic constant determination.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

1. Kolstiren, D.P. and Marburger, R.E., “Simplified procedure for Calculating Peak Position in X-Ray Residual Stress Msasurements on Hardened Steel”, ASM. Transactions, Vol. 51, 537 (1959).Google Scholar
2. Rachilnger, W.A., J. Sci. Instrunerrfs, VcJ” 25, 254 (1946).Google Scholar
3. Gupta, S.K. aid a a Cullity, “Fhsbl ens Associated with K-alpha Doublet In Residual Stress Measurement. “ Adv. in X-Ray Analysts. Vol. 23, 333 (1983).Google Scholar
4. Brown, A. and Edmonds, J.W., “The Fitting of Powder Diffraction profiles to an Analytical Expression and the Technique of Line Broadening Factors”, Adv. in X-Ray Analysis. Vol. 23, 361 (1980).Google Scholar
5. Hall, M.M.. ‘The Approximetion of Symmetric X-Ray Peaks by Pearson Type VII. istributions, “ J. Apl. Pyst., Vol. 10, 66 (1977).Google Scholar
6. Erizo, S. and Farrish, W. “A Method of Background Subtraction for the Aralysis of Broadened Profiles. “ Adv. in X-Ray Anal.. Vol. 27. 37 (1983).Google Scholar
7. Klug, H.P. and Alexander, L.E., X-Ray Powder Diffraction -Procedures. 2nd Ed,, Wiley, NY. p. 642, (1974).Google Scholar
8. Willson, A.J.C., Mathematicla Theory of X-Ray Powder Diffractometry, Oentrex, Eindhoven, (1963).Google Scholar
9. Prevey, P.S., “A Method of Determining Elastic Constants In Selected Crystal log-aphic Directions for X-Rey Diffraction Residual Stress Measurement. “ Adv. in X-Ray Analysis. Vol. 20, pp. 345-354, (1977).Google Scholar
10. Hauk, V.M. and Mecherauch, E., “A Useful Guide for X-Ray Stress Evaluation (XSE)”, Adv. in X-Ray Anal. Vol. 27, p. 82 (1983).Google Scholar
11. Prevey, P.S., ‘Comparison of X-Ray Diffraction Residual Stress Measurement Methods on Machined Surfaces. “ Adv. in X-Ray Anal.. Vol. 19, pp. 709-724, (1976).Google Scholar
12. Marion, A.H. and ohen, J.B., “Anomal les in the Measurement - of Residual Stress by X-Ray Diffraction. “Adv. in X-Ray Anal.. Vol. 18, (1975).Google Scholar
13. Dölle, H. and Cohen, J.B., “Residual Stresses In Ground Stees”, Met. Trans, A., Vol. 11A. pp. 159-164, (1900).Google Scholar