Hostname: page-component-5c6d5d7d68-wtssw Total loading time: 0 Render date: 2024-08-15T20:39:46.131Z Has data issue: false hasContentIssue false

The Recessed Source Geometry for Source Excited X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

C. A. N. Conde
Affiliation:
Physics Department University of Coimbra 3000 Coimbra, Portugal
J. M. F. dos Santos
Affiliation:
Physics Department University of Coimbra 3000 Coimbra, Portugal
Get access

Abstract

Different geometries are considered for source excited energy-dispersive X-ray fluorescence (EDXRF) analysis Systems, including the recessed source geometry introduced in the present work. The calculated physical excitation-detection efficiencies, for the side (or annular), central, receded and recessed source geometries are presented as a function of the target to source distance, for Ca, K, S and Si targets excited with a Fe-55 XBF-3 X-ray source and xenon filled gas proportional scintillation counters. The last two geometries present in gênerai the highest efficiencies. The recessed source geometry présent the best performance with peak efficiencies a factor of 3.3 better than those for the standard side or annular source geometries.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. ATX. 00, available from: Aurora Tech. Inc., 620 West Center St., Eld.l, North SaLt lake, Utah 84054, U. S. A.Google Scholar
2. X-MET. 40, available from: Outokumpu, Electronics Division, POB. 7, SF-02201 Espoo, Pinland. 960.Google Scholar
3. Gold Assayer, available from: EG&G. RTEC. 100 Midland Road, Oak Ridge, Tenu. 37830, U.S.A..Google Scholar
4. dos Santos, J.M.F. and Coude, C.A.M., to be published in Nucl. Instr. and Meth. - Part B. 1985).Google Scholar
5. Isotope Products Laboratories, 1800 N. Keystone Street, Burbank, California 91504, U. S. A..Google Scholar
6. Tertim, B. and Claisse, F., “Printipl-es of Quantitative X-Ray Fluotes- cence Analysis”, Heyden and Son Ltd., London (U. K.), 1982.Google Scholar
7. Robinson, J.W., “Handbook of Spectroscopy”, vol. III. CRC Press, Boca Raton, Florida, 1981.Google Scholar