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A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

T. C. Huang ,
W. Parrish  and
G. L. Ayers
T. C. Huang
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
W. Parrish
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
G. L. Ayers
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
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Abstract

This paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 407 - 412
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

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