Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-17T01:46:05.816Z Has data issue: false hasContentIssue false

Quantitative X-Ray Diffraction Analysis of Calcium Sulfates and Quartz in Wet-Process Phosphoric Acid Filter Cakes

Published online by Cambridge University Press:  06 March 2019

Kjell R. Waerstad*
Affiliation:
Tennessee Valley Authority, Muscle Shoals, Alabama. 35660
Get access

Abstract

A quantitative X-ray diffraction method has been developed for rapid determination of the crystalline phases present in by-product filter cakes from wet-process phosphoric acid manufacture. A new technique to reduce preferred orientation of the crystallites by removing the top layer of the X-ray samples with adhesive tape is described, statistical analysis of synthetic sample mixtures of CaS04.2H2O, CaSO4 · 0.5H20, CaSo4, and α-Si02 indicates that the calcium sulfate phases present in typical filter cakes can be determined with an accuracy of about 3% at the 95% confidence level; quartz can be determined at about 14%. The method has been applied to the analysis of 10 filter-cake samples from an experimental hemihydrate plant. The results are in good agreement with data from X-ray fluorescence and chemical analyses

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Dahlgren, S.E. “Calcium Sulfate Transitions in Superphosphate”, J. Agrlc. Food Chem. 8 (5), 411412 (1960).Google Scholar
2. Chung, F.H. “Quantitative Interpretation of X-Ray Diffraction Patterns of Mixtures. III. Simultaneous Determination of a Set of Reference Intensities”, J. Appl. Cryst. 8. 1719 (1975).Google Scholar
3. Hubbard, C.R. and Smith, D.K. “Experimental and Calculated Standards for Quantitative Analysis by Powder Diffraction”, Advances in X-ray Analysis 20. 2739 (1977).Google Scholar
4. Hubbard, C.R., Evans, E.H., and Smith, D.K. “The Reference Intensity Ratio, I/Ic, for Computer Simulated Powder Patterns“, J. AppI. Cryst. 9. 169174 (1976).Google Scholar
5. National Bureau of Standards, “Standard X-Ray Diffraction Powder Patterns”, BBS. onograph 25, Section 6, Washington, D. C. 1968.Google Scholar
6. Dixon, W.G. and Massey, F.J. Introduction to Statistical Analysis. 2nd ed., McGraw-Hill, New York, 1969, pp 114124.Google Scholar