Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-07-05T17:54:52.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Qualitative XRF Analysis with Pattern Recognition

Published online by Cambridge University Press:  06 March 2019

Lo. I. Yin  and
Stephen M. Seltzer
Lo. I. Yin
Affiliation:
Code 682, Laboratory for Astronomy and Solar Physics, NASA Goddard Space Flight Center, Greenbelt, MD 20771
Stephen M. Seltzer
Affiliation:
Center for Radiation Research, National Institute of Standards and Technology, Gaithersburg, MD 20899
Get access

Abstract

In many applications of energy-dispersive XRF analysis, quantitative information concerning the chemical composition of the samples is not required. Rather, one is interested in whether a given sample is similar to some reference material or whether the chemical composition is changing from one sample to the next. We have investigated the use of pattern-recognition techniques in such applications. It will be demonstrated with experimental data that the pattern-recognition approach is extremely simple and fast. It uses only a single parameter, the normalized correlation coefficient, and can be applied directly to raw data. The efficacy of the method is illustrated with Si(Li) spectra of geological and pigment samples, and proportional counter spectra of geological samples. The pattern-recognition method should be ideally suited for field XRF applications, and the algorithm can be easily implemented on a personal computer.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 603 - 613
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Tou, J.T., and Gonzales, R.C., 1974, “Pattern Recognition Principles”, Chapter 3, Addison-Wesley Publishing Co., Inc., Reading, MA.Google Scholar
Yin, L.I., Trombka, J.I., Seltzer, S.M., Johnson, R.G., and Philpotts, J.A., 1989, Possible use of pattern recognition for the analysis of Marsrover X-ray fluorescence spectra, J. Geo Phys. Res., in press.Google Scholar