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Precision Lattice Parameter Determination at Liquid Helium Temperatures by Double-Scanning Diffractometry

Published online by Cambridge University Press:  06 March 2019

Hubert W. King  and
Carolyn M. Preece
Hubert W. King
Affiliation:
Imperial College London, England
Carolyn M. Preece
Affiliation:
Imperial College London, England
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Abstract

The back-reflect ion double-scanning diffractometer method, by which lattice parameters can be measured with a reproducibility of one part in 150,000 has been applied at liquid helium temperatures. A cryostat attachment is described which enables diffraction profiles to be scanned on both sides of the primary X-ray beam up to 163°, 2θ. Alignment errors may, thus, be eliminated by measuring the included angle 4θ between respective Bragg reflections. The method is illustrated by measuring the lattice parameters of the I.U.Cr. standard specimens of silicon and tungsten at various cryogenic temperatures.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 354 - 365
Copyright
Copyright © International Centre for Diffraction Data 1966

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References

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