Hostname: page-component-5c6d5d7d68-wp2c8 Total loading time: 0 Render date: 2024-08-15T02:32:16.019Z Has data issue: false hasContentIssue false
  • English
  • Français

Grazing Incidence X-Ray Characterization of Materials

Published online by Cambridge University Press:  06 March 2019

D.K. Bowen  and
M. Wormington
D.K. Bowen
Affiliation:
University of Warwick, Coventry CV4 7AL and Bede Scientific Instruments Ltd., Software Division University of Warwick Science Park, Coventry CV4 7EZ
M. Wormington
Affiliation:
University of Warwick, Coventry CV4 7AL and Bede Scientific Instruments Ltd., Software Division University of Warwick Science Park, Coventry CV4 7EZ
Get access

Abstract

A review of the methods of characterization of materials using X-rays incident at grazing angles is presented. The rationale of all such methods is the need to obtain information from near-surface regions. The methods include grazing incidence diffraction, reflectivity, diffuse scatter and fluorescence. The experimental techniques are outlined, and the information obtainable and the methods of interpretation are discussed.

Type
V. X-Ray Characterization of Thin Films
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 171 - 184
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Compton, A. H., Phil. Mag. 45 1121 (1923)Google Scholar
2 von Kiessig, H., Ann. Physik 10 715 and 769(1931)Google Scholar
3 Afanasiev, A. M., Afanasiev, S. M., Aleksandrov, P. A., Imamov, R. M. and Pashaev, E. M., Physica Status Solidi A86, K1(1984)Google Scholar
4 Afanasiev, A. M., Imamov, R. M., Maslov, A. V. and Pashaev, E. M., Physica Status Solidi A84, 73(1984)Google Scholar
5 Aleksandrov, P. A., Afanasiev, A. M. and Stepanov, S. A., Physica Status Solidi A86, 143(1984)Google Scholar
6 Afanasiev, A. M., Aleksandrov, P. A., Imamov, R. M., Pashaev, E. M. and Polovinkina, V. I., Physica Status Solidi A90, 419(1985)Google Scholar
7 Dudley, M., Wuand, J. Yao, G. D., Nuclear Inst. and Meth. in Phys. Res. B40/41 388-392(1989)Google Scholar
8 Afanasiev, A. M. and Melkonyan, M. K., Acta Cryst, A39, 207–210(1983)Google Scholar
9 Rustichelli, F., Phil. Mag. 31, 1–12(1975)Google Scholar
10 Kishino, S., J. Phys. Soc. Japan 31, 1168 (1971)Google Scholar
11 Kishino, S. and Kohra, K., Japan J. Appl. Phys. 10, 551 (1971)Google Scholar
12 Materlik, G. and Kostroun, V. O., Rev. Sci. Instrum. 51, 86 (1980)Google Scholar
13 Bednyska, T., Physica Status Solidi A19, 365–372(1973)Google Scholar
14 Hartwig, J., Physica Status Solidi A37, 417 (1976)Google Scholar
15 Hartwig, J., Physica Status Solidi A42,495(1977)Google Scholar
16 Briihl, H.-G., Baumbach, T., Gottschalch, V., Ptetsch, U. and Lengeler, B., J. Appl. Cryst. 23, 228–233(1990)Google Scholar
17 Heche, H.-R., Nieber, J., Clansnitzer, M. arid Materlik, G., Physica Status Solidi A105, 53–60(1988)Google Scholar
18 Shiraiwiwa, T. and Fujino, N., Jap, J. Appl. Phys. 5, 886 (1966)Google Scholar
19 Parratt, L. G., Phys. Rev. 95 359 (1954)Google Scholar
20 Wormington, M., Bowen, D. K. and Tanner, B. K., Mat. Res. Soc. Symp. Proc. 238, 119 (1992)Google Scholar
21 Hart, M. and the late W. Parrish, private communication.Google Scholar
22 Loxley, N., Monteiro, A., Cooke, M. L., Bowen, D. K. and Tanner, B. K., Mater. Res. Soc. Symp. Proc. (1992)Google Scholar
23 Eisenberger, P. and Marra, W. C., Phys. Rev. Lett. 46, 1081-1084(1981)Google Scholar
24 Powell, A. R., Kubiak, R. A. A., Whall, T. E. and Bowen, D. K., J. Phys. D: Appl Phys., 23, 1745-1747(1990)Google Scholar
25 Powell, A. R., Kubiak, R. A. A., Whall, T. E., Parker, E.H.C. and Bowen, D. K., Mater. Res. Soc. Symp. Proc. 20, 115–120(1991)Google Scholar
26 Chu, X. and Tanner, B. K., Mats. Letts. 5, 153–155(1987)Google Scholar
27 Brunei, M. and de Bergevin, F., Acta Cryst. A42, 299-303(1986)Google Scholar
28 Brunei, M., Acta Cryst. A42, 304-309(1986)Google Scholar
29 Gilles, B. and Brunei, M., Nuclear Inst. and Meth. in Phys. Res. B44 331–335(1989)Google Scholar
30 Pons, F., Megtert, S., Pivin, J. C., Pequignot, M., Mairey, D. and Roques-Carmes, C., J. Appl. Cryst. 21, 197-205(1988)Google Scholar
31 Lim, G., Parrish, W., Ortiz, C., Beliotto, M. and Hart, M., J. Mater. Res. 2, 471-477(1987)Google Scholar
32 Parrish, W., Aust. J. Phys. 41, 101–112(1988)Google Scholar
33 Hart, M., Parrish, W. and Masciocchi, N., Appl. Phys. Letts. 50 897–899(1987)Google Scholar
34 Parrish, W., Hart, M. and Huang, T.C., J. Appl. Cryst. 19, 92-100(1986)Google Scholar
35 Bilderback, D. H. and Hubbard, J., Nucl. Instr. and Meth. in Phys. Res. A195, 85 and 91(1982)Google Scholar
36 Tanner, Brian K., Simon J. Miles, , Keith Bowen, D., Hart, Linda and Loxley, Neil, X-Ray Reflectometry from Semiconductor Surfaces and Interfaces, Mat, Res. Soc. Symp. Proc. 208, 345-350(1991).Google Scholar
37 Ncvot, L. and Croce, P., Rev. Phys. Appl., 15, 761 (1980)Google Scholar
38 Sinha, S. K., Sirota, E. B., Garoff, S. and Stanley, H. B., Phys. Rev. B38, 2297 (1988)Google Scholar
39 Pynn, R., Phys. Rev. B45, 602 (1992)Google Scholar
40 Sinha, S. K., Physica B173, 25 (1991)Google Scholar
41 Sanyal, M. K., Sinha, S.K., Gibaud, A., Satija, S. K., Majkrzak, C. F. and Homma, H., Mater. Res. Soc. Symp. Proc. 237, 393-387(1992)Google Scholar
42 Tanner, B. K. and Hudson, J. M., IEEE Trans. Magnetics (1992) (invited paper at Intermag 1992)Google Scholar
43 Iida, A., Sakurai, K., Yoshinaga, A. and Gohshi, Y., Nucl. Instr. and Meth. in Phys. Res. A246 736-8(1986)Google Scholar
44 de Boer, D.K.G., Advances in X-ray Analysis, 34 35-40(1991)Google Scholar
45 de Boer, D.K.G. and van den Hoogenhof, W. W., Spectrochimica Acta, 46B, 1323-1331(1991)Google Scholar
46 do Boer, D.K.G., Phys. Rev. B44 498-511(1991)Google Scholar
47 Powell, Adrian R., Bradler, Jaroslav, Thomas, Charles R., Kubiak, Richard A., Bowen, D. Keith, Wormington, Matthew and Hudson, John M., Mater. Res. Soc. Symp. Proc. (1992)238,653–658(1992)Google Scholar