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Depth Profiling of Ceramic Specimens using Multi-Wavelength X-Ray Bragg-Brentano Diffraction Data with Particular Reference to Zirconia-Aluminas

Published online by Cambridge University Press:  06 March 2019

A. van Riessen  and
B.H. O'Connor
A. van Riessen
Affiliation:
Department of Applied Physics Curtin University of Technology Perth, WA, Australia
B.H. O'Connor
Affiliation:
Department of Applied Physics Curtin University of Technology Perth, WA, Australia
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Abstract

Depth profile analysis of phase composition, residual strain and crystallite size in ceramic specimens can be determined by varying the information depth (ID) as defined by Delhez et al. (1988) for an x-ray opaque specimen. The information depth may be controlled by making use of the dependence of ID on Bragg angle and by selecting wavelengths which give appropriate x-ray absorption within the specimen.

Procedures are outlined for extracting depth profiles for (i) composition from intensity data and (ii) residual strain and crystallite size from peak width data. Results are described for both discrete-peak and Rietvetd pattern-fitting analysis of zirconiaalumina specimens for which preliminary results have been reported by van Riessen et al. (1990).

Type
III. Thin-Film and Surface Characterization by XRD
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 169 - 175
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Delhez, R., de Keijser, T.H., Mitlemeijer, E.J., Thijsse, B.J., Hollanders, M.A., Loopstra, O.B. and Sloof, W.G., 1988, Aust. J. of Physics. 41: 261.Google Scholar
2. van Riessen, A., O'Connor, B.H., Li, D.Y. and Stead, R.J., 1990, 20-26, in: “Proceedings of Austceram-90 International Ceramic Conference,” Darragh, P.J. and Stead, R.J., eds., Trans Tech Publications, Switzerland.Google Scholar
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