Skip to main content Accessibility help
×
Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-30T20:58:26.013Z Has data issue: false hasContentIssue false

14 - Broadband large-signal measurements for linearity optimization

from Part IV - Nonlinear measurements

Published online by Cambridge University Press:  05 June 2013

Marco Spirito
Affiliation:
Delft University of Technology
Mauro Marchetti
Affiliation:
Anteverta Microwave B.V.
Valeria Teppati
Affiliation:
Swiss Federal University (ETH), Zürich
Andrea Ferrero
Affiliation:
Politecnico di Torino
Mohamed Sayed
Affiliation:
Microwave and Millimeter Wave Solutions, Santa Rosa
Get access

Summary

Introduction

The recent introduction of high-performance modulation schemes (e.g. (W)-CDMA and OFDM) provides the capability of realizing high-data rate communication links (i.e. up to 100 Mbps from 20 MHz spectrum)[1]. The broadband nature of those signals together with the large difference between the peak and the average power across the modulation bandwidth requires a large number of spectral components to accurately represent the signal statistics. The modulated signal should be amplified by the transmitting chain without loss of information (i.e. low EVM) and with little out-of-band-distortion to avoid interference with adjacent transmitting channels. The quality of the communication link can be translated into specification parameters of the active element of the transmission chain, in the case of the PA, through the device IM3 and ACPR level. In general, it is very difficult to link the technology parameters of an active device directly to its linearity performance, since the linearity achieved for a given PA is the result of its interaction with the surrounding circuitry. For this reason, most attempts to improve the linearity of PAs are currently made at the circuit level.

In order to properly compare different technologies (e.g. SiGe and III-V) or device technology generations, one must provide the optimum loading conditions, at fundamental, harmonic, and baseband frequencies, to the active device during the evaluation phase, ideally under the same driving signal of the final application. This measurement task is intrinsically complex since the broadband nature of the signal of interest conflicts with the narrow-band nature of the currently employed high dynamic range receivers (i.e. narrow IF bandwidth super-heterodyne receivers.

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Motorola, Long Term Evolution (LTE): A Technical Overview. Motorola technical white paper, 2010.
[2] H., Arthaber, M., Mayer, and G., Magerl, “A broadband active harmonic load-pull setup with a modulated generator as active load,” in Microwave Conference, 2004. 34th European, 2, Oct. 2004, pp. 685–688.Google Scholar
[3] M., Spirito, M., Pelk, F., van Rijs, S., Theeuwen, D., Hartskeerl, and L., de Vreede, “Active harmonic load-pull for on-wafer out-of-band device linearity optimization,” IEEE Trans. Microw. Theory Tech., 54, no. 12, pp. 4225–4236, Dec. 2006.Google Scholar
[4] M., Marchetti, M., Pelk, K., Buisman, W., Neo, M., Spirito, and L., de Vreede, “Active harmonic load-pull with realistic wideband communications signals,” IEEE Trans. Microw. Theory and Tech., 56, no. 12, pp. 2979–2988, Dec. 2008.Google Scholar
[5] M., van der Heijden, H., de Graaff, and L., de Vreede, “A novel frequency-independent third-order intermodulation distortion cancellation technique for BJT amplifiers,” IEEE J. Solid-State Circuits, 37, no. 9, pp. 1176–1183, Sept. 2002.Google Scholar
[6] (2012) Agilent technologies website. [Online]. Available: http://www.home.agilent.com/agilent/product.jspx?nid=-33821.0.00&cc=US&lc=eng
[7] (2012) Tektronix website. [Online]. Available: http://www.tek.com/oscilloscope/dsa8300-sampling-oscilloscope
[8] M., Akmal, V., Carrubba, J., Lees, S., Bensmida, J., Benedikt, K., Morris, M., Beach, J., McGeehan, and P., Tasker, “Linearity enhancement of GaN HEMTs under complex modulated excitation by optimizing the baseband impedance environment,” in Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, June 2011, pp. 1–4.Google Scholar
[9] (2012) Miteq inc. website. [Online]. Available: http://www.miteq.com/
[10] (2012) Marki microwave website. [Online]. Available: http://www.markimicrowave.com/
[11] Agilent Technologies, Optimizing Dynamic Range for Distortion Measurements. Santa Rosa, CA: Agilent 5980-3079EN, 2000.
[12] D. M., Leenaerts, J., van der Tang, and C. S., Vaucher, Circuit Design for RF Transceivers. Boston, Dordrecht, London: Kluwer Academic Publishers, 2001.Google Scholar
[13] (2012) National instruments website. [Online]. Available: http://www.ni.com/data-acquisition/
[14] S., Vandenplas, J., Verspecht, F., Verbeyst, F., Vandamme, and M., Bossche, “Calibration issues for the large signal network analyzer (LSNA),” in ARFTG Conference Digest, Fall 2002, Washington, DC, Dec. 2002, pp. 99–106.Google Scholar
[15] K., Noujeim, J., Martens, and T., Roberts, “A frequency-scalable NLTL-based signal-source extension,” in 41st European Microwave Conference (EuMC), 2011, Manchester, UK, Oct. 2011, pp. 476–479.Google Scholar
[16] P., Roblin, Nonlinear RF Circuits and Nonlinear Vector Network Analyzers: Interactive Measurement and Design Technique. Cambridge UK: Cambridge University Press, 2011.Google Scholar
[17] M., Spirito, L. C. N., de Vreede, M., de Kok, M., Pelk, D., Hartskeerl, H. F. F., Jos, J. E., Mueller, and J., Burghartz, “A novel active harmonic load-pull setup for on-wafer device linearity characterization,” in Microwave Symposium Digest 2004, Fort Worth, TX, June 2004, pp. 1217–1220.Google Scholar
[18] D. D., Poulin, J. R., Mahon, and J. P., Lanteri, “A high power on-wafer pulsed active load pull system,” IEEE Trans. Microw. Theory Tech., 40, pp. 2412–2417, Dec. 1992.Google Scholar
[19] G., Madonna, A., Ferrero, M., Pirola, and U., Pisani, “Testing microwave devices under different source impedance values-anovel technique for on-line measurement of source and device reflection coefficients,” IEEE Trans. Instrum. Meas., 49, pp. 285–289, Apr. 2000.Google Scholar
[20] G. P., Bava, U., Pisani, and V., Pozzolo, “Active load technique for load-pull characterisation at microwave frequencies,” Electronics Letters, 18, pp. 178–180, Feb. 1982.Google Scholar
[21] D., Rytting, “Network analyzer error models and calibration methods,” White Paper, September, 1998.Google Scholar
[22] A., Ferrero and U., Pisani, “An improved calibration technique for on-wafer large-signal transistor characterization,” IEEE Trans. Instrum. Meas., 42, no. 2, pp. 360–364, Apr. 1993.Google Scholar
[23] L., Devlin and B., Minnis, “A versatile vector modulator design for MMIC,” in Microwave Symposium Digest, 1990., IEEE MTT-S International, May 1990, pp. 519–521, vol. 1.Google Scholar
[24] M., Squillante, M., Marchetti, M., Spirito, and L., de Vreede, “A mixed-signal approach for high-speed fully controlled multidimensional load-pull parameters sweep,” in Microwave Measurement Conference, 2009 73rd ARFTG, Jun. 2009, pp. 1–5.Google Scholar
[25] W. C. E., Neo, J., Qureshi, M. J., Pelk, J. R., Gajadharsing, and L. C. N., de Vreede, “A mixed-signal approach towards linear and efficient N-Way doherty amplifiers,” IEEE Trans. Microw. Theory Tech., 55, no. 5, pp. 866–879, May 2007.Google Scholar
[26] “UTRA (BS) FDD; Radio Transmission and Reception,” Technical Specification Group Radio Access Networks – 3rd Generation Partnership Project, 3GPP TS 25.104 V4.1.0 (2001-06), 2001.
[27] “Base station conformance testing (FDD),” Technical Speci?cation Group Radio Access Networks – 3rd Generation Partnership Project, 3GPP TS 25.141 V4.1.0 (2001-06), 2001.
[28] M., Marchetti, R., Heeres, M., Squillante, M., Pelk, M., Spirito, and L., de Vreede, “A mixed-signal load-pull system for base-station applications,” in Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE, May 2010, pp. 491–494.Google Scholar
[29] Z., Aboush, C., Jones, G., Knight, A., Sheikh, H., Lee, J., Lees, J., Benedikt, and P., Tasker, “High power active harmonic load-pull system for characterization of high power 100-watt transistors,” in 2005 European Microwave Conference, 1, Oct. 2005, p. 4.Google Scholar
[30] V., Teppati, A., Ferrero, and U., Pisani, “Recent advances in real-time load-pull systems,” IEEE Trans. Instrum. Meas., 57, no. 11, pp. 2640–2646, Nov. 2008.Google Scholar
[31] V., Aparin and C., Persico, “Effect of out-of-band terminations on intermodulation distortion in common-emitter circuits,” in Microwave Symposium Digest, 1999 IEEE MTT-S International, 3, 1999, pp. 977–980, vol. 3.Google Scholar
[32] D., Williams, J., Leckey, and P., Tasker, “Envelope domain analysis of measured time domain voltage and current waveforms provide for improved understanding of factors effecting linearity,” in Microwave Symposium Digest, 2003 IEEE MTT-S International, 2, June 2003, pp. 1411–1414, vol. 2.Google Scholar
[33] M., Spirito, M., van der Heijden, M., Pelk, L., de Vreede, P., Zampardi, L., Larson, and J., Burghartz, “Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers,” in Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005, Oct. 2005, pp. 112–115.Google Scholar
[34] A., Alghanim, J., Lees, T., Williams, J., Benedikt, and P., Tasker, “Using active IF load-pull to investigate electrical base-band induced memory effects in high-power ldmos transistors,” in APMC 2007, Asia-Pacific Microwave Conference, 2007, Dec. 2007, pp. 1–4.Google Scholar
[35] M., Mirra, M., Marchetti, F., Tessitore, M., Spirito, L., de Vreede, and L., Betts, “A multi-step phase calibration procedure for closely spaced multi-tone signals,” in 2010 75th ARFTG Microwave Measurements Conference (ARFTG), May 2010, pp. 1–5.Google Scholar
[36] J., Vuolevi, T., Rahkonen, and J., Manninen, “Measurement technique for characterizing memory effects in RF power amplifiers,” in Radio and Wireless Conference, 2000. RAWCON 2000. 2000 IEEE, 2000, pp. 195–198.Google Scholar
[37] J., Vuolevi, J., Manninen, and T., Rahkonen, “Cancelling the memory effects in RF power amplifiers,” in The 2001 IEEE International Symposium on Circuits and Systems, 2001. ISCAS 2001. 1, May 2001, pp. 57–60, vol. 1.Google Scholar
[38] P., Draxler, I., Langmore, T., Hung, and P., Asbeck, “Time domain characterization of power amplifiers with memory effects,” in Microwave Symposium Digest, 2003 IEEE MTT-S International, 2, June 2003, pp. 803–806, vol. 2.Google Scholar
[39] D., Hartskeerl, I., Volokhine, and M., Spirito, “On the optimum 2nd harmonic source and load impedances for the efficiency-linearity trade-off of RF LDMOS power amplifiers,” in Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE, June 2005, pp. 447–450.Google Scholar

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×