Skip to main content Accessibility help
×
Hostname: page-component-77c89778f8-m42fx Total loading time: 0 Render date: 2024-07-17T16:43:16.186Z Has data issue: false hasContentIssue false

14 - Nano-structuring using pulsed laser radiation

Published online by Cambridge University Press:  04 December 2009

Costas P. Grigoropoulos
Affiliation:
University of California, Berkeley
Get access

Summary

Introduction

Fundamental understanding of microscale phenomena has been greatly facilitated in recent years, largely due to the development of high-resolution mechanical, electrical, optical, and thermal sensors. Consequently, new directions have been created for the development of new materials that can be engineered to exhibit unusual properties at sub-micrometer scales. Surface engineering is a critical sub-field of nanotechnology because of the paramount importance of surface-interaction phenomena at the micro/nano-machine level. Nanofabrication of complex three-dimensional patterns cannot be accomplished with conventional thermo-chemo-mechanical processes. While laser-assisted processes have been effective in component microfabrication with basic dimensions in the few-micrometer range, there is an increasing need to advance the science and technology of laser processing to the nanoscale. Breakthroughs in various nanotechnologies, such as information storage, optoelectronics, and bio-fluidics, can be achieved only through basic research on nanoscale modification and characterization of surfaces designed to exhibit special topographical and compositional features at high densities.

Since their invention in the 1980s, scanning-microscopy techniques such as scanning tunneling microscopy (STM), atomic-force microscopy (AFM), scanning near-field optical microscopy, and further variants thereof, have not only become indispensable tools for ultrahigh-resolution imaging of surfaces and measurement of surface properties but also offered hitherto unexplored possibilities to locally modify materials at levels comparable to those of large atoms, single molecules, and atomic clusters. These nanometric investigation tools have been used extensively in numerous high-resolution nanostructuring studies, to manipulate single atoms, and also as effective all-inclusive nanofabrication tools.

Type
Chapter
Information
Transport in Laser Microfabrication
Fundamentals and Applications
, pp. 376 - 398
Publisher: Cambridge University Press
Print publication year: 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Ash, E. A., and Nicholls, G., 1972, “Super-Resolution Aperture Scanning Microscope,” Nature, 237, 510–512.CrossRefGoogle ScholarPubMed
Bachelot, R., H'Dhili, F., Barchiesi, D., 2003, “Apertureless Near-Field Optical Microscopy: A Study of the Local Tip Field Enhancement Using Photosensitive Azobenzene-Containing Films,” J. Appl. Phys., 94, 2060–2072.CrossRefGoogle Scholar
Bäuerle, D., 1998, “Laser-Induced Fabrication and Processing of Semiconductors: Recent Developments,” Phys. Status Solidi (a), 166, 543–554.3.0.CO;2-P>CrossRefGoogle Scholar
Bäuerle, D., 2000, Laser Processing and Chemistry, 3rd edn, Heidelberg, Springer-Verlag.CrossRefGoogle Scholar
Betzig, E., and Trautman, J. K., 1992, “Near-Field Optics: Microscopy, Spectroscopy and Surface Modification Beyond the Diffraction Limit,” Science, 257, 189–195.CrossRefGoogle ScholarPubMed
Betzig, E., Trautman, J. K., Harris, T. D., Weiner, J. S., and Kostelak, R. L., 1991, “Breaking the Diffraction Barrier: Optical Microscopy at Nanometric Scale,” Science, 251, 1468–1470.CrossRefGoogle ScholarPubMed
Boneberg, J., Munzer, H. J., Tresp, M., Ochmann, M., and Leiderer, P., 1998, “The Mechanism of Nanostructuring upon Nanosecond Laser Irradiation of a STM Tip,” Appl. Phys. A, 67, 381–384.CrossRefGoogle Scholar
Chen, G., and Hui, P., 1999, “Thermal Conductivities of Evaporated Gold Films on Silicon and Glass,” Appl. Phys. Lett., 74, 2942–2944.CrossRefGoogle Scholar
Chimmalgi, A., Choi, T.-Y., Grigoropoulos, C. P., and Komvopoulos, K., 2003, “Femtosecond Laser Apertureless Near-Field Nanomachining of Metals Assisted by Scanning Probe Microscopy,” Appl. Phys. Lett., 82, 1146–1148.CrossRefGoogle Scholar
Chimmalgi, A., Grigoropoulos, C. P., and Komvopoulos, K., 2005a, “Surface Nanostructuring by Nano-/Femtosecond Laser-Assisted Scanning Force Microscopy,” J. Appl. Phys., 97, 104319(1)–104319(12).CrossRefGoogle Scholar
Chimmalgi, A., Hwang, D. J., and Grigoropoulos, C. P., 2005b, “Nanoscale Rapid Melting and Crystallization of Semiconductor Thin Films,” Nano Lett., 5, 1924–1930.CrossRefGoogle ScholarPubMed
Chimmalgi, A., Hwang, D. J., and Grigoropoulos, C. P., 2007, “Near-Field Scanning Optical Microscopy Based Nanolithography Using Thin Metal Film Masks,” J. Phys. D. Conf. Ser., 59, 285–288.CrossRefGoogle Scholar
Dickmann, K., Jersch, J., and Demming, F., 1997, “Focusing of Laser Radiation in the Near-Field of a Tip (FOLANT) for Applications in Nanostructuring,” Surf. Interface Anal., 25, 500–504.3.0.CO;2-6>CrossRefGoogle Scholar
Ebbesen, T. W., Lezec, H. J., Ghaemi, H. F., Thio, T., and Wolff, P. A., 1998, “Extraordinary Optical Transmission through Sub-wavelength Hole Arrays,” Nature, 391, 667–669.CrossRefGoogle Scholar
Gorbunov, A. A., and Pompe, W., 1994, “Thin Film Nanoprocessing by Laser/STM Combination,” Phys. Status Solidi A, 145, 333–338.CrossRefGoogle Scholar
Hecht, B., Sick, B., Wild, U. P., 2000, “Scanning Near-Field Optical Microscopy with Aperture Probes: Fundamentals and Applications,” J. Chem. Phys., 112, 7761–7774.CrossRefGoogle Scholar
Huang, S. M., Hong, M. H., Lu, Y. F., 2002, “Pulsed-Laser Assisted Nanopatterning of Metallic Layers Combined with Atomic Force Microscopy,” J. Appl. Phys., 91, 3268–3274.CrossRefGoogle Scholar
Huber, R., Koch, M., and Feldmann, J., 1998, “Laser-Induced Thermal Expansion of a Scanning Tunneling Microscope Tip Measured with an Atomic Force Microscope Cantilever,” Appl. Phys. Lett., 73, 2521–2523.CrossRefGoogle Scholar
Hwang, D. J., 2005, Pulsed Laser Processing of Electronic Materials in Micro/Nanoscale, Ph.D. Dissertation, University of California, Berkeley.Google Scholar
Hwang, D. J., Chimmalgi, A., and Grigoropoulos, C. P., 2006a, “Ablation of Thin Metal Films by Short-Pulsed Lasers Coupled through Near-Field Scanning Optical Microscopy Probes,” J. Appl. Phys., 99, 044905.CrossRefGoogle Scholar
Hwang, D. J., Grigoropoulos, C. P., Yoo, J., and Russo, R. E., 2006b, “Optical Near-Field Ablation Induced Plasma Characteristics,” Appl. Phys. Lett., 89, 254101.CrossRefGoogle Scholar
Jersch, J., and Dickmann, K., 1996, “Nanostructure Fabrication Using Laser Field Enhancement in the Near Field of a Scanning Tunneling Microscope Tip,” Appl. Phys. Lett., 68, 868–870.CrossRefGoogle Scholar
Jersch, J., Demming, F., and Dickmann, K., 1997, “Nanostructuring with Laser Radiation in the Nearfield of a Tip from a Scanning Force Microscope,” Appl. Phys. A, 64, 29–32.CrossRefGoogle Scholar
Kawata, Y., Xu, C., and Denk, W., 1999, “Feasibility of Molecular-Resolution Fluorescence Near-Field Microscopy Using Multi-photon Absorption and Field Enhancement near a Sharp Tip,” J. Appl. Phys., 85, 1294–1301.CrossRefGoogle Scholar
Lee, M., Moon, S., Hatano, M., Suzuki, K., and Grigoropoulos, C. P., 2000, “Relationship between Fluence Gradient and Lateral Grain Growth in Spatially Controlled Excimer Laser Crystallization of Amorphous Silicon Films,” J. Appl. Phys., 88, 4994–4999.CrossRefGoogle Scholar
Lee, M., Moon, S., and Grigoropoulos, C. P., 2001, “In situ Visualization of Interface Dynamics during the Double Laser Recrystallization of Amorphous Silicon Thin Films,” J. Cryst. Growth, 226, 8–10.CrossRefGoogle Scholar
Lewis, A., Isaacson, M., Harootunian, A., and Muray, A., 1984, “Development of a 500 Å Spatial Resolution Light Microscope I. Light Is Efficiently Transmitted through Lambda/16 Diameter Apertures,” Ultramicroscopy, 13, 227–231.CrossRefGoogle Scholar
Lieberman, K., Shani, Y., Melnik, I., Yoffe, S., and Sharon, Y., 1999, “Near-Field Optical Photomask Repair with a Femtosecond Laser,” J. Microscopy, 194, 537–541.CrossRefGoogle ScholarPubMed
Lu, Y. F., Hu, B., Mai, Z. H.et al., 2001, “Laser-Scanning Probe Microscope Based Nanoprocessing of Electronics Materials,” Jap. J. Appl. Phys., 40, 4395–4398.CrossRefGoogle Scholar
Lu, Y. F., Mai, Z. H., Qiu, G., and Chim, W. K., 1999, “Laser-induced Nano-oxidation on Hydrogen-Passivated Ge (100) Surfaces under a Scanning Tunneling Microscope Tip,” Appl. Phys. Lett., 75, 2359–2361.CrossRefGoogle Scholar
Margetic, V., Pakulev, , Stockhaus, A., , A.et al., 2000, “A Comparison of Nanosecond and Femtosecond Laser-Induced Plasma Spectroscopy of Brass Samples,” Spectrochim. Acta B – Atomic Spectrosc., 55, 1771–1785.CrossRefGoogle Scholar
Meggers, W. F., Corliss, C. H., and Scribner, B. F., 1961, Table of Spectral-Line Transitions, Part I, Washington D.C., National Bureau of Standards.Google Scholar
Müller, R., and Lienau, C., 2001, “Three-Dimensional Analysis of Light Propagation through Uncoated Near-Field Fibre Probes,” J. Microscopy, 202, 339–346.CrossRefGoogle ScholarPubMed
Nolte, S., Chichkov, B. N., Welling, H.et al., 1999, “Nanostructuring with Spatially Localized Femtosecond Laser Pulses,” Opt. Lett., 24, 914–916.CrossRefGoogle ScholarPubMed
Ohtsu, M., 1998, Near-Field Nano/Atom Optics and Technology, Tokyo, Springer-Verlag.CrossRefGoogle Scholar
Pistor, T. V., 2001, Electromagnetic Simulation and Modeling with Applications in Lithography, Memorandum No. UCB/ERL M01/19, Berkeley, University of California.Google Scholar
Pohl, D. W., Denk, W., and Lanz, M., 1984, “Optical Stethoscopy: Image Recording with Resolution λ/20, Appl. Phys. Lett., 44, 651–653.CrossRefGoogle Scholar
Quate, C. F., 1997, “Scanning Probes as a Lithography Tool for Nanostructures,” Surf. Sci., 386, 259–264.CrossRefGoogle Scholar
Sanchez, J., Novotny, L., and Xie, X. S., 1999, “Near-Field Fluorescence Microscopy Based on Two-Photon Excitation with Metal Tips,” Phys. Rev. Lett., 82, 4014–4017.CrossRefGoogle Scholar
Smith, A. N., Hostetler, J. L., and Norris, P. M., 1999, “Nonequilibrium Heating in Metal Films: An Analytical and Numerical Analysis,” Num. Heat Transfer A, 35, 859–873.Google Scholar
Stöckle, R., Setz, P., Deckert, V., 2001, “Nanoscale Atmospheric Pressure Laser Ablation–Mass Spectrometry, Anal. Chem., 73, 1399–1402.CrossRefGoogle ScholarPubMed
Stolk, P. A., Polman, A., and Sinke, W. C., 1993, “Experimental Test of Kinetic Theories for Heterogeneous Freezing in Silicon,” Phys. Rev. B, 47, 5–13.CrossRefGoogle ScholarPubMed
Sun, J., and Longtin, J. P., 2001, “Inert Gas Beam Delivery for Ultrafast Laser Micromachining at Ambient Pressure,” J. Appl. Phys., 89, 8219–8224.CrossRefGoogle Scholar
Synge, E. H., 1928, “A Suggested Method for Extending Microscopic Resolution into the Ultra-microscopic Region,” Phil. Mag., 6, 356–362.CrossRefGoogle Scholar
Ukraintsev, V. A., and Yates, J. T., 1996, “Nanosecond Laser Induced Single Atom Deposition with Nanometer Spatial Resolution using a STM,” J. Appl. Phys., 80, 2561–2571.CrossRefGoogle Scholar
Wanke, M. C., Lehmann, O., Muller, K., Qingzhe, W., and Stuke, M., 1997, “Laser Rapid Prototyping of Photonic Band-Gap Microstructures,” Science, 275, 1284–1286.CrossRefGoogle ScholarPubMed
Wegscheider, S., Kirsch, A., Mlynek, J., and Krausch, G., 1995, “Scanning Near-Field Optical Lithography,” Thin Solid Films, 264, 264–267.CrossRefGoogle Scholar
Wysocki, G., Heitz, J., and Bäuerle, D., 2004, “Near-Field Optical Nanopatterning of Crystalline Silicon,” Appl. Phys. Lett., 84, 2025–2027.CrossRefGoogle Scholar
Yamada, N., Ohno, E., Nishiuchi, K., Akahira, N., and Takao, M., 1991, “Rapid-Phase Transitions of GeTe–Sb2Te3 Pseudobinary Amorphous Thin-Films for an Optical Disk Memory,” J. Appl. Phys., 69, 2849–2856.CrossRefGoogle Scholar

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×