Skip to main content Accessibility help
×
Hostname: page-component-77c89778f8-cnmwb Total loading time: 0 Render date: 2024-07-21T07:16:10.777Z Has data issue: false hasContentIssue false

20 - Fault-tolerant topological cluster state quantum computing

from Part VI - Topological methods

Published online by Cambridge University Press:  05 September 2013

Austin Fowler
Affiliation:
The University of Melbourne
Kovid Goyal
Affiliation:
Previously at California Institute of Technology
Daniel A. Lidar
Affiliation:
University of Southern California
Todd A. Brun
Affiliation:
University of Southern California
Get access

Summary

Introduction

Cluster states were introduced in Chapter 18, along with some of the approaches to achieving fault tolerance in measurement-based quantum computing. In this chapter, we describe an extremely promising fault-tolerant cluster state quantum computing scheme [RH07, RHG07] with a threshold error rate of 7.46 × 10−3, low overhead arbitrarily long-range logical gates and novel adjustable strength error correction capable of correcting general errors through the correction of Z errors only. Detailed proposed implementations of this scheme exist for ion traps [SJ09] and single photons with cavity mediated interactions [DGI+07].

The discussion is organized as follows. In Section 20.2, we describe the topological cluster state, which is a specific three-dimensional (3D) cluster state, and give a brief overview of what topological cluster state quantum computing involves. Section 20.3 describes logical qubits in more detail and how to initialize them to ∣0L〉 and ∣+L〉 and measure them in the ZL and XL bases. State injection, the non-fault-tolerant construction of arbitrary logical states, is covered in Section 20.4. Logical gates, namely the logical identity gate and the logical CNOT gate, are discussed in Section 20.5 along with their byproduct operators. Section 20.6 describes the errorcorrection procedure. In Section 20.7, we calculate an estimate for the threshold of this scheme.

Section 20.8 presents an analysis of the overhead as a function of both the circuit size and the error rate.

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×