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Transmission Electron Microscopy and X-Ray Diffraction Analysis of Aluminum-Induced Crystallization of Amorphous Silicon in α-Si:H/Al and Al/α-Si:H Structures
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue 2 / April 2005
- Published online by Cambridge University Press:
- 08 March 2005, pp. 133-137
- Print publication:
- April 2005
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- Article
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