2 results
Improvement of Depth Resolution of ADF-SCEM by Deconvolution: Effects of Electron Energy Loss and Chromatic Aberration on Depth Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 3 / June 2012
- Published online by Cambridge University Press:
- 12 April 2012, pp. 603-611
- Print publication:
- June 2012
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- Article
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Three-Dimensional Imaging in Aberration-Corrected Electron Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
- Published online by Cambridge University Press:
- 22 June 2010, pp. 445-455
- Print publication:
- August 2010
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- Article
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