2 results
Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 30 April 2015, pp. 544-556
- Print publication:
- June 2015
-
- Article
- Export citation
Chemical Vapor Deposition of Porous GaN Particles on Silicon
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
- Published online by Cambridge University Press:
- 26 July 2012, pp. 905-911
- Print publication:
- August 2012
-
- Article
- Export citation