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Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold Finger
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 5 / October 2016
- Published online by Cambridge University Press:
- 05 October 2016, pp. 981-986
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- October 2016
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Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 16 April 2015, pp. 594-605
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- June 2015
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Surface Charge and Carbon Contamination on an Electron-Beam-Irradiated Hydroxyapatite Thin Film Investigated by Photoluminescence and Phase Imaging in Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 2 / April 2014
- Published online by Cambridge University Press:
- 09 April 2014, pp. 586-595
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- April 2014
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Electron Beam Bombardment Induced Decrease of Cathodoluminescence Intensity from GaN Not Caused by Absorption in Buildup of Carbon Contamination
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 9 / 2004
- Published online by Cambridge University Press:
- 13 June 2014, e8
- Print publication:
- 2004
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Field Emission and Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 4 / July 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 380-387
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- July 2000
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