9 results
Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 684-685
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- August 2014
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Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 682-683
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- August 2014
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Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1258-1259
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- August 2013
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Construction of a SXES spectrometer for a conventional SEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1278-1279
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- August 2013
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Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 938-939
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- July 2012
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High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 776-777
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- July 2012
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An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 604-605
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- July 2011
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Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1308-1309
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- July 2010
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A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 34-35
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- July 2010
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