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Proliferation of Faulty Materials Data Analysis in the Literature
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 1 / February 2020
- Published online by Cambridge University Press:
- 17 January 2020, pp. 1-2
- Print publication:
- February 2020
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Analysis of Thin Phase-Shifter Films using Surface Analysis Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 394-395
- Print publication:
- July 2016
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Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
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- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
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- May 2012
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Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 23 May 2011, pp. 418-430
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- June 2011
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Introduction to a Special Issue on Surface Analysis
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- Journal:
- Microscopy Today / Volume 19 / Issue 2 / March 2011
- Published online by Cambridge University Press:
- 28 February 2011, p. 10
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- March 2011
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Characterization of Surface and Sub- Surface Defects on Devices using Complimentary Techniques
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- Journal:
- Microscopy Today / Volume 16 / Issue 6 / November 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-20
- Print publication:
- November 2008
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