4 results
A Fast and Accurate Workflow for Analytic 3D FIB-SEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 918-919
- Print publication:
- August 2019
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Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 142-143
- Print publication:
- August 2014
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Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 5 / October 2010
- Published online by Cambridge University Press:
- 16 July 2010, pp. 604-613
- Print publication:
- October 2010
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Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 612-613
- Print publication:
- July 2010
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