2 results
Imaging Light Atoms at Sub-Ångström Resolution in an Image Side CS-Corrected Electron Microscope FEI Titan 80-300
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 30-31
- Print publication:
- September 2007
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- Article
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Quantitative and Automated Analysis of HR-TEM Electron Exit Plane Waves using the EWAC Code
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 44-45
- Print publication:
- September 2007
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- Article
- Export citation