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Imaging Light Atoms at Sub-Ångström Resolution in an Image Side CS-Corrected Electron Microscope FEI Titan 80-300

Published online by Cambridge University Press:  07 September 2007

Svete M ,
Mader W ,
Houben L  and
Tillmann K
Svete M
Affiliation:
University of Bonn, Germany
Mader W
Affiliation:
University of Bonn, Germany
Houben L
Affiliation:
Forschungszentrum Jülich GmbH, Germany
Tillmann K
Affiliation:
Forschungszentrum Jülich GmbH, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 30 - 31
Copyright
Copyright © Microscopy Society of America 2007

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