10 results
Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2634-2635
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- August 2022
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Test and Characterization of a New Post-column Imaging Energy Filter
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2634-2635
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- August 2020
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On the Benefit of Aberration Correction in Cryo Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2156-2157
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- August 2020
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Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2150-2151
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- August 2020
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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 878-879
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- July 2016
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Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 378-379
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- August 2014
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Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 934-935
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- August 2014
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Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 442-455
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- December 2006
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Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 584-585
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- August 2002
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Benefits and Possibilities of Cc–Correction for TEM / STEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 12-13
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- August 2002
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