13 results
Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 6 / December 2021
- Published online by Cambridge University Press:
- 21 September 2021, pp. 1420-1430
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- December 2021
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Dose Rate Considerations for Semiconductor Electronics: Why Current Variations Enable Unique GaN-based Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3064-3066
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- August 2020
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The Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2874-2876
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- August 2020
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Towards Atomic Resolution Electron Microscopy with Structured Temporal Electron Illumination of Picosecond Time Resolution
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1652-1653
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- August 2019
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Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III - Nitride Electronic Devices
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1972-1973
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- August 2018
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Understanding Ziegler-Natta Catalyst Structure via Low-Dose Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1968-1969
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- August 2018
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Electron Beam-Induced Object Excitations at Atomic Resolution - Minimization and Exploitation
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1792-1793
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- July 2017
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In-line Holography with Single Atom Sensitivity: Challenges and Achievements
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 848-849
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- July 2016
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Atomic Resolution Phase Contrast Imaging and In-Line Holography Using Variable Voltage and Dose Rate
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- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 22 October 2012, pp. 982-994
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- October 2012
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Are the Materials Properties of Indiumnitride Dominated by Defects?
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- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F02-01
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- 2007
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Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 492-497
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- December 2006
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Direct Electron Beam Processing Of Semiconductor Nanostructures
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- MRS Online Proceedings Library Archive / Volume 727 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, R11.11
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- 2002
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Fracture Toughness, Fracture Planes and BDT in Stoichiometric Feal and Nial Single Crystals
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- MRS Online Proceedings Library Archive / Volume 364 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 207
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- 1994
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