8 results
Reverse Engineering at the Atomic Scale: Competitive Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode
-
- Journal:
- Microscopy Today / Volume 22 / Issue 5 / September 2014
- Published online by Cambridge University Press:
- 29 August 2014, pp. 12-19
- Print publication:
- September 2014
-
- Article
-
- You have access
- HTML
- Export citation
Performance Advances in LEAP systems
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1120-1121
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1014-1015
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
New Applications in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1022-1023
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Laser-Specimen Interactions in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 584-585
- Print publication:
- July 2012
-
- Article
- Export citation
New Applications in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 926-927
- Print publication:
- July 2012
-
- Article
- Export citation
Atom Probe Tomography Analysis of Grain Boundaries in CdTe
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 928-929
- Print publication:
- July 2012
-
- Article
- Export citation
The Role of Atomic Scale Investigation in the Development of Nanoscale Materials for Information Storage Applications
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 3 / June 2004
- Published online by Cambridge University Press:
- 01 June 2004, pp. 366-372
- Print publication:
- June 2004
-
- Article
- Export citation