12 results
RF Photoinjector Based Time-Resolved MeV Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 653-654
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- August 2015
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Contributors
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- Operating Room Leadership and Management
- Published online:
- 05 October 2012
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- 04 October 2012, pp ix-xi
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High performance SiC detectors for MeV ion beams generated by intense pulsed laser plasmas
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- Journal of Materials Research / Volume 28 / Issue 1 / 14 January 2013
- Published online by Cambridge University Press:
- 05 July 2012, pp. 87-93
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- 14 January 2013
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Contributors
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- Essential Clinical Anesthesia
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- 05 January 2012
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- 11 July 2011, pp xv-xxviii
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RF Photoinjector Based Femtosecond Relativistic Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 488-489
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- July 2010
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Novel Radio-Frequency Gun Structures for Ultrafast Relativistic Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 4 / August 2009
- Published online by Cambridge University Press:
- 03 July 2009, pp. 290-297
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- August 2009
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Structural and electrical characterization of n+-type ion-implanted 6H-SiC
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- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
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- 15 July 2004, pp. 239-242
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- July 2004
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The SPARC/X SASE-FEL Projects
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- Laser and Particle Beams / Volume 22 / Issue 3 / July 2004
- Published online by Cambridge University Press:
- 01 July 2004, pp. 341-350
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Structural and Electrical Characterisation of Nickel Silicides Contacts on Silicon Carbide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E6.9
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- 2001
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Structural Properties of 3C-SiC Layers Grown on Si Substrates by Electron Cyclotron Resonance CVD Technique
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- MRS Online Proceedings Library Archive / Volume 640 / 2000
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- 21 March 2011, H5.9
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- 2000
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Carbon Rich a-Si1-xCx:H Films: An Investigation On Radiative Recombination Properties
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- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 261
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- 1998
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Defect annealing in ion implanted silicon carbide
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 7 / July 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1727-1733
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- July 1997
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