6 results
Optimized Ultra-Fast Low Dose Electron Detection
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2198-2199
- Print publication:
- August 2022
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Optimizing Workflow in Electron Microscopes with Fast BSE/STEM Diodes and Preamplifier Modules
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 538-539
- Print publication:
- August 2019
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Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 474-475
- Print publication:
- August 2019
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Live Quantitative BSE Acquisition with Standard-less Calibration
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 654-655
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- August 2018
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New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 650-651
- Print publication:
- August 2018
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A Dedicated Backscattered Electron Detector for High Speed Imaging and Defect Inspection
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 10-11
- Print publication:
- July 2017
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