38 results
Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 918-919
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- July 2017
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 32-33
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- July 2016
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Interpretation of Energy-Filtered BSE Images at Ultra Low Voltage Conditions
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 34-35
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- August 2014
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High contrast BSE Imaging under Ultra Low Voltage condition by FE-SEM with Energy Filtering
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1176-1177
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- August 2013
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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Simultaneous Imaging of Surface and Bulk at Atomic Resolution
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 306-307
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- July 2012
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 388-389
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- July 2012
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Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 374-375
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- July 2012
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Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1298-1299
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- July 2011
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High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 09 April 2017, pp. 930-931
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- July 2011
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Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 610-611
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- July 2010
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High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 128-129
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- July 2010
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High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 102-103
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- July 2010
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Naturally-Formed Nanoscale Phase Separation in Epitaxially-Grown III-V Semiconductor Alloys
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1470-1471
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- July 2010
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Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 136-137
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- July 2010
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Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 4-5
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- July 2009
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Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 114-115
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- July 2009
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Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 836-837
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- August 2008
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Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1386-1387
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- August 2008
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The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1374-1375
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- August 2008
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