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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM

  • H. Inada (a1), K. Nakamura (a1), K. Tamura (a1), Y. Suzuki (a1), T. Sato (a1), M. Konno (a1), D. Su (a2), J. Wall (a2), Y. Zhu (a2) and J. Ciston (a3)...

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM

  • H. Inada (a1), K. Nakamura (a1), K. Tamura (a1), Y. Suzuki (a1), T. Sato (a1), M. Konno (a1), D. Su (a2), J. Wall (a2), Y. Zhu (a2) and J. Ciston (a3)...

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