4 results
STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 132-133
- Print publication:
- August 2018
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Atomically Resolved EELS Elemental and Fine Structure Mapping via Multi-Frame and Energy-Offset Correction Acquisition
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 448-449
- Print publication:
- August 2018
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New Concepts for 3D Optics in X-ray Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 288-289
- Print publication:
- August 2018
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Applications of the SESAM in Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1126-1127
- Print publication:
- August 2001
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