4 results
Quantitative Measurement of Electric Fields in Microelectronics Devices by In-Situ Pixelated STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 480-482
- Print publication:
- August 2022
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Introduction
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 14 March 2017, p. 911
- Print publication:
- 14 March 2017
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Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 254-255
- Print publication:
- August 2014
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Interfacial Stress: The Importance of Stress Relaxation in TEM Cross-Sections
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 262-263
- Print publication:
- August 2004
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