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Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 702-703
- Print publication:
- July 2012
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- Article
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Silicon Carbide Power Devices and Processing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C1.3
- Print publication:
- 2003
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- Article
- Export citation