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High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 100-101
- Print publication:
- July 2016
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D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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D035 Depth Resolved Strain Analysis of Lateral Nonostructures Produced by Focused GA ION Implantation in GAAS
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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Strain Induced Compositional Modulations in AlGaAs Overlayers Induced by Lateral Surface Gratings
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- Journal:
- MRS Online Proceedings Library Archive / Volume 618 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 41
- Print publication:
- 2000
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Investigation of Inhomogeneous In-Plane Strain Relaxation in Si/SiGe Quantum Wires by High Resolution x-ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 590 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 207
- Print publication:
- 1999
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