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Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1392-1393
- Print publication:
- July 2009
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Applications of Multibeam SEM/FIB Instrumentation in the Integrated Sciences
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- Journal:
- Microscopy Today / Volume 17 / Issue 4 / July 2009
- Published online by Cambridge University Press:
- 26 June 2009, pp. 34-39
- Print publication:
- July 2009
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