6 results
In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 1020
- Print publication:
- August 2021
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In-situ Correlative Analysis of Electrical and Mechanical Properties of 3D Nanostructures by Combination of AFM, SEM and FIB
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1800-1801
- Print publication:
- August 2020
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3D Nano-Probes for Thermal Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1872-1873
- Print publication:
- August 2018
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3D Nanoprinting via Focused Electron Beams
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 346-347
- Print publication:
- August 2018
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DFB Structures in Electroactive Conjugated Polymers realized by Soft Lithography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 739 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, H3.7
- Print publication:
- 2002
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Self-Assembled Growth of Highly Oriented Para- Sexiphenyl Thin Films Controlled by Elastic Strain
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- Journal:
- MRS Online Proceedings Library Archive / Volume 665 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, C5.24
- Print publication:
- 2001
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