3 results
Synchrotron x-ray topography studies of twin structures in lanthanum aluminate single crystals
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 7 / July 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1847-1855
- Print publication:
- July 1992
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Combined Tem and X-Ray Topographic Characterization of InxGa1−xAs/GaAs Strained Layer Systems.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 209 / 1990
- Published online by Cambridge University Press:
- 26 February 2011, 655
- Print publication:
- 1990
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Influence of Surface Relaxation on X-Ray Topographic Imaging of Interfacial Dislocations in Heterosystems.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 209 / 1990
- Published online by Cambridge University Press:
- 26 February 2011, 707
- Print publication:
- 1990
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